EECS105: Microelectronic Devices and Circuits
Faculty in charge: Prof. Rabaey
Description: The course covers analysis of bipolar and MOS circuits, propagation delay and noise margins, dynamic logic concepts, regenerative logic circuits, and memories.
EECS143: Processing and design of Integrated Circuits
Faculty in charge: Profs. Cheung and Spanos
Description: This clean room lab is very unique in the undergraduate curriculum. The students design, lay out, build and characterize simple semiconductor circuits, including a ring oscillator.
Currently, the above courses time share the use of a limited number
of Hewlett Packard Semiconductor Parameter Analyzers. We have
recently automated the characterization process in EECS143 to
increase the efficiency of use of the SPAs, but still fall short
in the larger EECS105 labs. EECS105 and EECS141 share the same
lab space, and we are currently targeting the two labs for a major
revision. Just a few weeks ago, we received 12 Hewlett Packard
54615B DSOs to replace the slower 100 MHz Tektronix analog scopes,
and still need to replace the old Fluke DMMs, add PCs and put
the new scopes on-line with the MSM/HPIB modules.
EECS40, 40I, 41I: Introduction to Electrical Engineering (Self-Study)
Faculty in charge: Profs. Howe, White
This lab course covers passive circuit analysis, analog and digital building blocks and systems, semiconductor devices, and simple circuits.
We currently have over 200 take-home kits for the introductory courses, due to a shortage of lab space. The kits include some basic electronic active and passive components and either a Micronta DMM or VOM. The Micronta meters are not very rugged, and have been failing at a high rate. We are requesting hand-held meters that are better suited for such a harsh environment, both physical and electronic.
EECS113: Power Electronics
Faculty in charge: Prof. Sanders
This recently revised lecture lab contains experiments involving
characterization and design of magnetic devices, semiconductor
power devices and power control and conversion. We are requesting
a rack-mount 1800-W electronic load mainframe along with two 600-W
electronic loads to allow us to test our circuits under a controllable
load. In the lab, we have an HP4195A, and are requesting an impedance
test kit to allow us to make measurement of various components
used in the lab.
EECS120: Signals and Systems
Faculty in charge: Profs. Kahn and Fearing
Description: This junior level lab has been well received in the Department. The course covers frequency response, modulation, sampling, aliasing, and PID controllers, using HPVEE. A fourth station will ease crowding and reduce the impact on our existing resources.
EECS135: Microwave, Optics, and Plasma Laboratory
Faculty in charge: Prof. Lieberman and Dr. Tien
Description: This course includes 18 separate experiments ranging
from optics, plasmas, vacuum systems, and microwave design and
analysis. The lab needs to be updated, and the scopes will be
used to make high frequency measurements in fiber optic and MHD
booster stage rocket experiments.
EECS192: Mechatronic Design Laboratory
Faculty in charge: Prof. Fearing, Dr. Flynn
This senior design course focuses on application of theoretical principles in electrical engineering to control of a small-scale system, such as a mobile robot. Small teams of students design and construct a mechatronic system incorporating sensors, actuators, and intelligence.
The lab consists of 6 independent stations, and a triple supply is requested for each, to assist in the development of logic and interface circuits and high current bipolar motor drive stages.
EECS145L: Introductory Electronic Transducer Laboratory
Faculty in charge: Dr. Derenzo
This lab explores a variety of electronics transducers for force, displacement, sound, light, ionic potential, using circuits for low-level differential amplification and analog signal processing and use of microcomputers for digital sampling and display.
EECS145M: Introductory Microcomputer Interfacing Laboratory
Faculty in charge: Dr. Derenzo
In this lab students construct basic interface circuits and write code for data acquisition, storage, analysis, display, and control.
EECS100: Electronic Techniques in Engineering
Faculty in charge: Dr. Wujek
This overview course covers analysis of passive circuits, sinusoidal steady-state response, transient response, operational amplifiers, digital building blocks, digital systems, microprocessor control, power systems, and control.
The existing DMMs do not offer sufficient accuracy, are not identical,
EECS125: Introduction to Robotics
Faculty in charge: Prof. Sastry
This lab serves as an introduction to kinematics, dynamics and control of robot manipulators, robotics vision, sensing and the programming of robots. We have three robot arms in the lab, and are adding a magnetic bearing and air turbine experiments. The scopes in the lab are old Tektronix 5000 series scopes, and the mechanical switches have worn out, making measurements very unreliable.
EECS150: Components and Design Techniques for Digital Systems
Faculty in charge: Profs. Katz and Newton
This extremely popular course covers basic building blocks and design methods to construct synchronous digital systems, logic families, finite state machines, and a substantial design project. The existing Tektronix 2230 oscilloscopes are difficult to use, are wearing out, and are not longer supported by the manufacturer. The Hewlett Packard 1651A logic analyzers that would be displaced would be welcomed by the EECS105 and EECS141 shared laboratory.
For various student projects, Instruction needs a fast logic analyzer with a pattern generator. This piece of equipment would float from lab to lab, as needed.
(please see Priority One)
The lab characterizes various passive and magnetic components used in switching power circuits and a good impedance meter is requested.
EECS117: Electromagnetic Fields and Waves
Faculty in charge: Profs. Lieberman and Neureuther
The lab has 6 fixed experiments on statics, transmission lines, and waves. The addition of the requested equipment would allow for accurate measurement of transmission line experiments.